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Title 

Grain-size effect on the electrical properties of nanocrystalline indium tin oxide thin films

Authors 

J H LeeY H KimS J AhnTai Hwan HaH S Kim

Publisher 

Elsevier

Issue Date 

2015

Citation 

Materials Science and Engineering: B, vol. 199, no. 0, pp. 37-41

Keywords 

Grain size effectIndium tin oxide (ITO)NanocrystallineTransmission electron microscopy

Abstract 

In this paper, we demonstrate the electrical properties, depending on grain size, of nanocrystalline indium tin oxide (ITO) thin films prepared with a solution process. The size distributions of nanometer-sized ITO film grains increased as the post-annealing temperature increased after deposition; the grain sizes were comparable with the calculated electron mean free path. The mobility of ITO thin films increased with increasing grain size; this phenomenon was explained by adopting the charge-trapping model for grain boundary scattering. These findings suggest that it is possible to improve mobility by reducing the number of trapping sites at the grain boundary.

ISSN 

0921-5107

Link 

http://dx.doi.org/10.1016/j.mseb.2015.04.011

Appears in Collections

1. Journal Articles > Journal Articles

Registered Date

2019-05-02


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